Measurement Results


- Since the resonance frequency varies significantly compared to the empty state, the x-axis represents the resonance frequency with the sample inserted.
- The results include data that cannot be measured with standard software.
Key Point!
- The measurement range depends on the permittivity and thickness of the material.
- When either the thickness or permittivity is high, measurement becomes more difficult. However, with our specially designed software, such materials can still be accurately measured!
- The special software can also be upgraded from the standard version.
Alumina samples with a thickness of 500 µm can now be measured using the split-cylinder method! Previously, standard software required the sample to be processed to 100 µm or less. However, with our newly developed (custom) software, thicker samples can now be accurately measured. This solution is particularly effective for evaluating ceramics and other materials that have relatively high Dk and are difficult to machine into thin forms. Even low-permittivity materials such as PTFE can be measured at thicknesses up to 1 mm.
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System Configuration
- Split cylinder 10/20/24/28/35/40 GHz CR-7xx
- Software for Split cylinder (with an option for measuring high Dk) CR-MA-BU
- Keysight Streamline USB Vector Network Analyzer P5007A
Samples
- alumina 99.9% 550 µm
- yttria 520 µm
- forsterite 540 µm
- PTFE 1 mm