Measurement Results
Key Point!
- Non-self-supporting samples can be measured by selecting an appropriate substrate.
- The dielectric properties of the adhesive alone are calculated from measurements of the substrate and the substrate with adhesive.
Non-self-supporting samples such as adhesive films and coatings can be measured up to 330 GHz by using an appropriate substrate. In this example, the adhesive film was measured while bonded to a substrate, and the result was compared with a measurement of the substrate alone to calculate the dielectric properties of the adhesive.
Although this approach introduces slightly more uncertainty than measurements of self-supporting films, it still provides useful data even for relatively low-loss materials.
FEATURED PRODUCTS
CONTACT
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System Configuration
- Fabry-Perot resonators, broadband, D-band, and J-band, FP-BB/D/J (EM labs)
- Permittivity measurement software for Fabry-Perot resonators, FP-MA (EM labs)
- Vector network analyzer: N5290A (Keysight Technologies)
- Mini VNAX frequency extender module: N5262BW03 (Keysight Technologies)
- Mini VNAX frequency extender module: N5262BW06 (Keysight Technologies)
Measured Samples
- Adhesive film, 150 micrometers
Additional Information
Samples were provided by Oji Holdings Corporation.