Measurement Results


Key Point!
- Ideal for high-loss materials with a dielectric loss tangent (Df) of approximately 0.01 or higher!
- Even when switching between different setups, measurement continuity is maintained—allowing seamless data acquisition up to 330 GHz without noticeable shifts.
- Not suitable for low-loss materials (samples must be significantly thicker for accurate results).
The free-space method enables wideband characterization of various materials’ frequency-dependent behavior. We evaluated a range of resins from 60 to 330 GHz. While low-loss materials like PTFE cannot be measured with high accuracy, this method is highly effective for evaluating high-loss materials or those that are difficult to machine into thin samples.
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System Configuration
- Free space 18-330 GHz FS-330(EM labs)
- Material Measurement Software FS-MA(EM labs)
- Network Analyzer:N5290A(Keysight Technologies)
- Mini VNAX frequency extension module: N5262BW03 (Keysight Technologies)
- Mini VNAX frequency extension module: N5262BW05 (Keysight Technologies)
- Mini VNAX frequency extension module: N5262BW06 (Keysight Technologies)
Samples
- PTFE, Polycarbonate, PVC (2 mm)